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Practice of electron microscopy on nanoparticles sensitive to radiation damage: CsPbBr(3) nanocrystals as a case study
In-depth and reliable characterization of advanced nanoparticles is crucial for revealing the origin of their unique features and for designing novel functional materials with tailored properties. Due to their small size, characterization beyond nanometric resolution, notably, by transmission electr...
Autores principales: | Duong, Tuan M., Sharma, Kshipra, Agnese, Fabio, Rouviere, Jean-Luc, Okuno, Hanako, Pouget, Stéphanie, Reiss, Peter, Ling, Wai Li |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Frontiers Media S.A.
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9808052/ https://www.ncbi.nlm.nih.gov/pubmed/36605121 http://dx.doi.org/10.3389/fchem.2022.1058620 |
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