An Efficient and Intelligent Detection Method for Fabric Defects based on Improved YOLOv5

Limited by computing resources of embedded devices, there are problems in the field of fabric defect detection, including small defect size, extremely unbalanced aspect ratio of defect size, and slow detection speed. To address these problems, a sliding window multihead self-attention mechanism is p...

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Detalles Bibliográficos
Autores principales: Lin, Guijuan, Liu, Keyu, Xia, Xuke, Yan, Ruopeng
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9824629/
https://www.ncbi.nlm.nih.gov/pubmed/36616696
http://dx.doi.org/10.3390/s23010097

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9824629/
https://www.ncbi.nlm.nih.gov/pubmed/36616696
http://dx.doi.org/10.3390/s23010097

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