Deciphering key genomic regions controlling flag leaf size in wheat via integration of meta-QTL and in silico transcriptome assessment

BACKGROUND: Grain yield is a complex and polygenic trait influenced by the photosynthetic source-sink relationship in wheat. The top three leaves, especially the flag leaf, are considered the major sources of photo-assimilates accumulated in the grain. Determination of significant genomic regions an...

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Detalles Bibliográficos
Autores principales: Kong, Binxue, Ma, Jingfu, Zhang, Peipei, Chen, Tao, Liu, Yuan, Che, Zhuo, Shahinnia, Fahimeh, Yang, Delong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: BioMed Central 2023
Materias:
Research
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9854125/
https://www.ncbi.nlm.nih.gov/pubmed/36658498
http://dx.doi.org/10.1186/s12864-023-09119-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9854125/
https://www.ncbi.nlm.nih.gov/pubmed/36658498
http://dx.doi.org/10.1186/s12864-023-09119-5

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