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A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning
Electronic manufacturing and design companies maintain test sites for a range of products. These products are designed according to the end-user requirements. The end user requirement, then, determines which of the proof of design and manufacturing tests are needed. Test sites are designed to carry...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9861238/ https://www.ncbi.nlm.nih.gov/pubmed/36679504 http://dx.doi.org/10.3390/s23020705 |