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A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning

Electronic manufacturing and design companies maintain test sites for a range of products. These products are designed according to the end-user requirements. The end user requirement, then, determines which of the proof of design and manufacturing tests are needed. Test sites are designed to carry...

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Detalles Bibliográficos
Autores principales: Siddiqui, Atif, Otero, Pablo, Zubair, Muhammad
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9861238/
https://www.ncbi.nlm.nih.gov/pubmed/36679504
http://dx.doi.org/10.3390/s23020705