Cargando…

A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning

Electronic manufacturing and design companies maintain test sites for a range of products. These products are designed according to the end-user requirements. The end user requirement, then, determines which of the proof of design and manufacturing tests are needed. Test sites are designed to carry...

Descripción completa

Detalles Bibliográficos
Autores principales: Siddiqui, Atif, Otero, Pablo, Zubair, Muhammad
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9861238/
https://www.ncbi.nlm.nih.gov/pubmed/36679504
http://dx.doi.org/10.3390/s23020705

Ejemplares similares