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Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe
In this paper, we introduce a low-cost, expansible, and compatible measurement and control system for atomic force microscopes (AFM) based on a quartz tuning fork (QTF) self-sensing probe and frequency modulation, which is mainly composed of an embedded control system and a probe system. The embedde...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9862387/ https://www.ncbi.nlm.nih.gov/pubmed/36677289 http://dx.doi.org/10.3390/mi14010227 |