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Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe

In this paper, we introduce a low-cost, expansible, and compatible measurement and control system for atomic force microscopes (AFM) based on a quartz tuning fork (QTF) self-sensing probe and frequency modulation, which is mainly composed of an embedded control system and a probe system. The embedde...

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Autores principales: Luo, Yongzhen, Ding, Xidong, Chen, Tianci, Su, Tao, Chen, Dihu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9862387/
https://www.ncbi.nlm.nih.gov/pubmed/36677289
http://dx.doi.org/10.3390/mi14010227
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author Luo, Yongzhen
Ding, Xidong
Chen, Tianci
Su, Tao
Chen, Dihu
author_facet Luo, Yongzhen
Ding, Xidong
Chen, Tianci
Su, Tao
Chen, Dihu
author_sort Luo, Yongzhen
collection PubMed
description In this paper, we introduce a low-cost, expansible, and compatible measurement and control system for atomic force microscopes (AFM) based on a quartz tuning fork (QTF) self-sensing probe and frequency modulation, which is mainly composed of an embedded control system and a probe system. The embedded control system is based on a dual-core OMAPL138 microprocessor (DSP + ARM) equipped with 16 channels of a 16-bit high-precision general analog-to-digital converter (ADC) and a 16-bit high-precision general digital-to-analog converter (DAC), six channels of an analog-to-digital converter with a second-order anti-aliasing filter, four channels of a direct digital frequency synthesizer (DDS), a digital input and output (DIO) interface, and other peripherals. The uniqueness of the system hardware lies in the design of a high-precision and low-noise digital—analog hybrid lock-in amplifier (LIA), which is used to detect and track the frequency and phase of the QTF probe response signal. In terms of the system software, a software difference frequency detection method based on a digital signal processor (DSP) is implemented to detect the frequency change caused by the force gradient between the tip and the sample, and the relative error of frequency measurement is less than 3%. For the probe system, a self-sensing probe controller, including an automatic gain control (AGC) self-excitation circuit, is designed for a homemade balanced QTF self-sensing probe with a high quality factor (Q value) in an atmospheric environment. We measured the quality factor (Q value) of the balanced QTF self-sensing probes with different lengths of tungsten tips and successfully realized AFM topography imaging with a tungsten-tip QTF probe 3 mm in length. The results show that the QTF-based self-sensing probe and the developed AFM measurement and control system can obtain high quality surface topography scanning images in an atmospheric environment.
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spelling pubmed-98623872023-01-22 Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe Luo, Yongzhen Ding, Xidong Chen, Tianci Su, Tao Chen, Dihu Micromachines (Basel) Article In this paper, we introduce a low-cost, expansible, and compatible measurement and control system for atomic force microscopes (AFM) based on a quartz tuning fork (QTF) self-sensing probe and frequency modulation, which is mainly composed of an embedded control system and a probe system. The embedded control system is based on a dual-core OMAPL138 microprocessor (DSP + ARM) equipped with 16 channels of a 16-bit high-precision general analog-to-digital converter (ADC) and a 16-bit high-precision general digital-to-analog converter (DAC), six channels of an analog-to-digital converter with a second-order anti-aliasing filter, four channels of a direct digital frequency synthesizer (DDS), a digital input and output (DIO) interface, and other peripherals. The uniqueness of the system hardware lies in the design of a high-precision and low-noise digital—analog hybrid lock-in amplifier (LIA), which is used to detect and track the frequency and phase of the QTF probe response signal. In terms of the system software, a software difference frequency detection method based on a digital signal processor (DSP) is implemented to detect the frequency change caused by the force gradient between the tip and the sample, and the relative error of frequency measurement is less than 3%. For the probe system, a self-sensing probe controller, including an automatic gain control (AGC) self-excitation circuit, is designed for a homemade balanced QTF self-sensing probe with a high quality factor (Q value) in an atmospheric environment. We measured the quality factor (Q value) of the balanced QTF self-sensing probes with different lengths of tungsten tips and successfully realized AFM topography imaging with a tungsten-tip QTF probe 3 mm in length. The results show that the QTF-based self-sensing probe and the developed AFM measurement and control system can obtain high quality surface topography scanning images in an atmospheric environment. MDPI 2023-01-15 /pmc/articles/PMC9862387/ /pubmed/36677289 http://dx.doi.org/10.3390/mi14010227 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Luo, Yongzhen
Ding, Xidong
Chen, Tianci
Su, Tao
Chen, Dihu
Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe
title Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe
title_full Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe
title_fullStr Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe
title_full_unstemmed Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe
title_short Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe
title_sort measurement and control system for atomic force microscope based on quartz tuning fork self-induction probe
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9862387/
https://www.ncbi.nlm.nih.gov/pubmed/36677289
http://dx.doi.org/10.3390/mi14010227
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