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Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe

In this paper, we introduce a low-cost, expansible, and compatible measurement and control system for atomic force microscopes (AFM) based on a quartz tuning fork (QTF) self-sensing probe and frequency modulation, which is mainly composed of an embedded control system and a probe system. The embedde...

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Detalles Bibliográficos
Autores principales:	Luo, Yongzhen, Ding, Xidong, Chen, Tianci, Su, Tao, Chen, Dihu
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2023
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9862387/ https://www.ncbi.nlm.nih.gov/pubmed/36677289 http://dx.doi.org/10.3390/mi14010227

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