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Process Optimization and Performance Evaluation of TSV Arrays for High Voltage Application
In order to obtain high-quality through-silicon via (TSV) arrays for high voltage applications, we optimized the fabrication processes of the Si holes, evaluated the dielectric layers, carried out hole filling by Cu plating, and detected the final structure and electric properties of the TSVs. The S...
Autores principales: | Feng, Liuhaodong, Zeng, Shuwen, Su, Yongquan, Wang, Lihao, Xu, Yang, Guo, Song, Chen, Shuo, Ji, Yucheng, Peng, Xinlin, Wu, Zhenyu, Wang, Shinan |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9863637/ https://www.ncbi.nlm.nih.gov/pubmed/36677165 http://dx.doi.org/10.3390/mi14010102 |
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