Simulation of Layer Thickness Measurement in Thin Multi-Layered Material by Variable-Focus Laser Ultrasonic Testing

Thin multi-layered materials are widely used in key structures of many high technology industries. To ensure the quality and safety of structures, layer thickness measurement by non-destructive testing (NDT) techniques is essential. In this paper, a novel approach for the measurement of each layer’s...

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Detalles Bibliográficos
Autores principales: Qiu, Jinxing, Li, Zhengying, Pei, Cuixiang, Luo, Guoqiang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9864888/
https://www.ncbi.nlm.nih.gov/pubmed/36679491
http://dx.doi.org/10.3390/s23020694

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9864888/
https://www.ncbi.nlm.nih.gov/pubmed/36679491
http://dx.doi.org/10.3390/s23020694

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