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Simulation of Layer Thickness Measurement in Thin Multi-Layered Material by Variable-Focus Laser Ultrasonic Testing

Thin multi-layered materials are widely used in key structures of many high technology industries. To ensure the quality and safety of structures, layer thickness measurement by non-destructive testing (NDT) techniques is essential. In this paper, a novel approach for the measurement of each layer’s...

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Autores principales: Qiu, Jinxing, Li, Zhengying, Pei, Cuixiang, Luo, Guoqiang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9864888/
https://www.ncbi.nlm.nih.gov/pubmed/36679491
http://dx.doi.org/10.3390/s23020694
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author Qiu, Jinxing
Li, Zhengying
Pei, Cuixiang
Luo, Guoqiang
author_facet Qiu, Jinxing
Li, Zhengying
Pei, Cuixiang
Luo, Guoqiang
author_sort Qiu, Jinxing
collection PubMed
description Thin multi-layered materials are widely used in key structures of many high technology industries. To ensure the quality and safety of structures, layer thickness measurement by non-destructive testing (NDT) techniques is essential. In this paper, a novel approach for the measurement of each layer’s thickness in thin multi-layered material is proposed by using ring-shaped laser generated focused ultrasonic bulk waves. The proposed method uses a ring-shaped laser with a variable radius to generate shear waves with variable focus inside the structure. By analyzing the signal characteristics at the ring center when the laser radius varies from zero to maximum, the direct measurement of layer thickness can be realized, considering that only when the focal depth and the layer thickness satisfy the specific relationship, the reflected shear waves converge and form a peak at the ring center. This straightforward approach can increase the pulse-echo SNR and prevent the processing of aliasing signals, and therefore provides higher efficiency and accuracy for the layer thickness measurement. In order to investigate the feasibility of this method, finite element simulations were conducted to simulate the ring-shaped laser generated ultrasonic waves in multi-layered structure in detail. Following the principle of the proposed method, the layer thickness of a bi-layer and 3-layer structure were respectively measured using simulation data. The results confirm that the proposed method can accurately and efficiently measure the layer thickness of thin multi-layered material.
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spelling pubmed-98648882023-01-22 Simulation of Layer Thickness Measurement in Thin Multi-Layered Material by Variable-Focus Laser Ultrasonic Testing Qiu, Jinxing Li, Zhengying Pei, Cuixiang Luo, Guoqiang Sensors (Basel) Article Thin multi-layered materials are widely used in key structures of many high technology industries. To ensure the quality and safety of structures, layer thickness measurement by non-destructive testing (NDT) techniques is essential. In this paper, a novel approach for the measurement of each layer’s thickness in thin multi-layered material is proposed by using ring-shaped laser generated focused ultrasonic bulk waves. The proposed method uses a ring-shaped laser with a variable radius to generate shear waves with variable focus inside the structure. By analyzing the signal characteristics at the ring center when the laser radius varies from zero to maximum, the direct measurement of layer thickness can be realized, considering that only when the focal depth and the layer thickness satisfy the specific relationship, the reflected shear waves converge and form a peak at the ring center. This straightforward approach can increase the pulse-echo SNR and prevent the processing of aliasing signals, and therefore provides higher efficiency and accuracy for the layer thickness measurement. In order to investigate the feasibility of this method, finite element simulations were conducted to simulate the ring-shaped laser generated ultrasonic waves in multi-layered structure in detail. Following the principle of the proposed method, the layer thickness of a bi-layer and 3-layer structure were respectively measured using simulation data. The results confirm that the proposed method can accurately and efficiently measure the layer thickness of thin multi-layered material. MDPI 2023-01-07 /pmc/articles/PMC9864888/ /pubmed/36679491 http://dx.doi.org/10.3390/s23020694 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Qiu, Jinxing
Li, Zhengying
Pei, Cuixiang
Luo, Guoqiang
Simulation of Layer Thickness Measurement in Thin Multi-Layered Material by Variable-Focus Laser Ultrasonic Testing
title Simulation of Layer Thickness Measurement in Thin Multi-Layered Material by Variable-Focus Laser Ultrasonic Testing
title_full Simulation of Layer Thickness Measurement in Thin Multi-Layered Material by Variable-Focus Laser Ultrasonic Testing
title_fullStr Simulation of Layer Thickness Measurement in Thin Multi-Layered Material by Variable-Focus Laser Ultrasonic Testing
title_full_unstemmed Simulation of Layer Thickness Measurement in Thin Multi-Layered Material by Variable-Focus Laser Ultrasonic Testing
title_short Simulation of Layer Thickness Measurement in Thin Multi-Layered Material by Variable-Focus Laser Ultrasonic Testing
title_sort simulation of layer thickness measurement in thin multi-layered material by variable-focus laser ultrasonic testing
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9864888/
https://www.ncbi.nlm.nih.gov/pubmed/36679491
http://dx.doi.org/10.3390/s23020694
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