Few-shot deep learning for AFM force curve characterization of single-molecule interactions

Deep learning (DL)-based analytics has the scope to transform the field of atomic force microscopy (AFM) with regard to fast and bias-free measurement characterization. For example, AFM force-distance curves can help estimate important parameters of binding kinetics, such as the most probable ruptur...

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Detalles Bibliográficos
Autores principales: Waite, Joshua R., Tan, Sin Yong, Saha, Homagni, Sarkar, Soumik, Sarkar, Anwesha
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9868661/
https://www.ncbi.nlm.nih.gov/pubmed/36699737
http://dx.doi.org/10.1016/j.patter.2022.100672

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9868661/
https://www.ncbi.nlm.nih.gov/pubmed/36699737
http://dx.doi.org/10.1016/j.patter.2022.100672

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