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Few-shot deep learning for AFM force curve characterization of single-molecule interactions
Deep learning (DL)-based analytics has the scope to transform the field of atomic force microscopy (AFM) with regard to fast and bias-free measurement characterization. For example, AFM force-distance curves can help estimate important parameters of binding kinetics, such as the most probable ruptur...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Elsevier
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9868661/ https://www.ncbi.nlm.nih.gov/pubmed/36699737 http://dx.doi.org/10.1016/j.patter.2022.100672 |