Putting High-Index Cu on the Map for High-Yield, Dry-Transferred CVD Graphene

[Image: see text] Reliable, clean transfer and interfacing of 2D material layers are technologically as important as their growth. Bringing both together remains a challenge due to the vast, interconnected parameter space. We introduce a fast-screening descriptor approach to demonstrate holistic dat...

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Detalles Bibliográficos
Autores principales: Burton, Oliver J., Winter, Zachary, Watanabe, Kenji, Taniguchi, Takashi, Beschoten, Bernd, Stampfer, Christoph, Hofmann, Stephan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2023
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9878973/
https://www.ncbi.nlm.nih.gov/pubmed/36594782
http://dx.doi.org/10.1021/acsnano.2c09253

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9878973/
https://www.ncbi.nlm.nih.gov/pubmed/36594782
http://dx.doi.org/10.1021/acsnano.2c09253

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