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Improving the Neural Segmentation of Blurry Serial SEM Images by Blind Deblurring

Serial scanning electron microscopy (sSEM) has recently been developed to reconstruct complex largescale neural connectomes, through learning-based instance segmentation. However, blurry images are inevitable amid prolonged automated data acquisition due to imprecision in autofocusing and autostigma...

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Detalles Bibliográficos
Autores principales: Cheng, Ao, Kang, Kai, Zhu, Zhanpeng, Zhang, Ruobing, Wang, Lirong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9879678/
https://www.ncbi.nlm.nih.gov/pubmed/36711194
http://dx.doi.org/10.1155/2023/8936903