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Deep-learning-based precise characterization of microwave transistors using fully-automated regression surrogates
Accurate models of scattering and noise parameters of transistors are instrumental in facilitating design procedures of microwave devices such as low-noise amplifiers. Yet, data-driven modeling of transistors is a challenging endeavor due to complex relationships between transistor characteristics a...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9879951/ https://www.ncbi.nlm.nih.gov/pubmed/36702862 http://dx.doi.org/10.1038/s41598-023-28639-4 |