Femtosecond-resolved imaging of a single-particle phase transition in energy-filtered ultrafast electron microscopy

Using an energy filter in transmission electron microscopy has enabled elemental mapping at the atomic scale and improved the precision of structural determination by gating inelastic and elastic imaging electrons, respectively. Here, we use an energy filter in ultrafast electron microscopy to enhan...

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Detalles Bibliográficos
Autores principales: Kim, Ye-Jin, Nho, Hak-Won, Ji, Shaozheng, Lee, Hyejin, Ko, Hyunhyub, Weissenrieder, Jonas, Kwon, Oh-Hoon
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Association for the Advancement of Science 2023
Materias:
Physical and Materials Sciences
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9882981/
https://www.ncbi.nlm.nih.gov/pubmed/36706188
http://dx.doi.org/10.1126/sciadv.add5375

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9882981/
https://www.ncbi.nlm.nih.gov/pubmed/36706188
http://dx.doi.org/10.1126/sciadv.add5375

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