Fundamental and higher eigenmodes of qPlus sensors with a long probe for vertical-lateral bimodal atomic force microscopy

The detection of vertical and lateral forces at the nanoscale by atomic force microscopy (AFM) reveals various mechanical properties on surfaces. The qPlus sensor is a widely used force sensor, which is built from a quartz tuning fork (QTF) and a sharpened metal probe, capable of high-resolution ima...

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Detalles Bibliográficos
Autores principales: Yamada, Yuya, Ichii, Takashi, Utsunomiya, Toru, Kimura, Kuniko, Kobayashi, Kei, Yamada, Hirofumi, Sugimura, Hiroyuki
Formato: Online Artículo Texto
Lenguaje:English
Publicado: RSC 2022
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9890686/
https://www.ncbi.nlm.nih.gov/pubmed/36756504
http://dx.doi.org/10.1039/d2na00686c

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9890686/
https://www.ncbi.nlm.nih.gov/pubmed/36756504
http://dx.doi.org/10.1039/d2na00686c

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