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Microstructure and morphology of the soldering interface of Sn–2.0Ag–1.5Zn low Ag content lead-free solder ball and different substrates

Eutectic Sn–Ag–Cu lead-free solder has limited applications due to cost and reliability issues. Sn–Ag–Zn solder has the advantages of low melting point, good mechanical properties and reliable welding interface. However, the research system of low silver content Sn–Ag–Zn solder is incomplete. In thi...

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Detalles Bibliográficos
Autores principales: Xiao, Jin, Tong, Xing, Liang, Jinhui, Chen, Quankun, Tang, Qiming
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9898020/
https://www.ncbi.nlm.nih.gov/pubmed/36747560
http://dx.doi.org/10.1016/j.heliyon.2023.e12952
_version_ 1784882366483791872
author Xiao, Jin
Tong, Xing
Liang, Jinhui
Chen, Quankun
Tang, Qiming
author_facet Xiao, Jin
Tong, Xing
Liang, Jinhui
Chen, Quankun
Tang, Qiming
author_sort Xiao, Jin
collection PubMed
description Eutectic Sn–Ag–Cu lead-free solder has limited applications due to cost and reliability issues. Sn–Ag–Zn solder has the advantages of low melting point, good mechanical properties and reliable welding interface. However, the research system of low silver content Sn–Ag–Zn solder is incomplete. In this paper, Sn–2.0Ag–1.5Zn low silver content alloy solder is soldered to different substrates. The interfacial reaction after soldering and the microstructure and reliability under different aging treatment conditions are studied. Sn–2.0Ag–1.5Zn solder is made into solder balls by direct melting method. The solder balls are placed in a solder strength tester to be heated and welded to the substrate, and then the solder joints are placed in a heating furnace for aging treatment. The results show that the solder is soldered to the bare Cu substrate, and a dense double-layer Intermetallic Compound (IMC) structure of Cu(5)Zn(8) and Ag(3)Sn is formed at the interface after aging treatment. The double-layer structure blocks each other, limiting the development of copper-tin IMCs. The solder is soldered with the Cu substrate electroplated with Ni barrier layer, and the soldering interface forms a thin layer of Ni(3)Sn(4) metal compound. After aging for 1000 h, the thickness of Ni(3)Sn(4) is about 1 μm, the thickness of Ni barrier layer is kept at 2–3 μm, and the barrier effect of Ni barrier layer is stable. Sn–2.0Ag–1.5Zn solder has excellent loss performance in long aging treatment. It has good heat-resistance aging treatment, good quality of solder connection, high interface reliability and less environmental pollution. The low silver content in Sn–2.0Ag–1.5Zn solder results in a significant cost reduction. Coarse IMC Ag(3)Sn is not easily formed. The optimized ratio of Ag and Zn in Sn–2.0Ag–1.5Zn solder improves the strength and toughness of the solder joint. The performance has been improved, and it is a very promising alloy solder.
format Online
Article
Text
id pubmed-9898020
institution National Center for Biotechnology Information
language English
publishDate 2023
publisher Elsevier
record_format MEDLINE/PubMed
spelling pubmed-98980202023-02-05 Microstructure and morphology of the soldering interface of Sn–2.0Ag–1.5Zn low Ag content lead-free solder ball and different substrates Xiao, Jin Tong, Xing Liang, Jinhui Chen, Quankun Tang, Qiming Heliyon Research Article Eutectic Sn–Ag–Cu lead-free solder has limited applications due to cost and reliability issues. Sn–Ag–Zn solder has the advantages of low melting point, good mechanical properties and reliable welding interface. However, the research system of low silver content Sn–Ag–Zn solder is incomplete. In this paper, Sn–2.0Ag–1.5Zn low silver content alloy solder is soldered to different substrates. The interfacial reaction after soldering and the microstructure and reliability under different aging treatment conditions are studied. Sn–2.0Ag–1.5Zn solder is made into solder balls by direct melting method. The solder balls are placed in a solder strength tester to be heated and welded to the substrate, and then the solder joints are placed in a heating furnace for aging treatment. The results show that the solder is soldered to the bare Cu substrate, and a dense double-layer Intermetallic Compound (IMC) structure of Cu(5)Zn(8) and Ag(3)Sn is formed at the interface after aging treatment. The double-layer structure blocks each other, limiting the development of copper-tin IMCs. The solder is soldered with the Cu substrate electroplated with Ni barrier layer, and the soldering interface forms a thin layer of Ni(3)Sn(4) metal compound. After aging for 1000 h, the thickness of Ni(3)Sn(4) is about 1 μm, the thickness of Ni barrier layer is kept at 2–3 μm, and the barrier effect of Ni barrier layer is stable. Sn–2.0Ag–1.5Zn solder has excellent loss performance in long aging treatment. It has good heat-resistance aging treatment, good quality of solder connection, high interface reliability and less environmental pollution. The low silver content in Sn–2.0Ag–1.5Zn solder results in a significant cost reduction. Coarse IMC Ag(3)Sn is not easily formed. The optimized ratio of Ag and Zn in Sn–2.0Ag–1.5Zn solder improves the strength and toughness of the solder joint. The performance has been improved, and it is a very promising alloy solder. Elsevier 2023-01-13 /pmc/articles/PMC9898020/ /pubmed/36747560 http://dx.doi.org/10.1016/j.heliyon.2023.e12952 Text en © 2023 Published by Elsevier Ltd. https://creativecommons.org/licenses/by-nc-nd/4.0/This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).
spellingShingle Research Article
Xiao, Jin
Tong, Xing
Liang, Jinhui
Chen, Quankun
Tang, Qiming
Microstructure and morphology of the soldering interface of Sn–2.0Ag–1.5Zn low Ag content lead-free solder ball and different substrates
title Microstructure and morphology of the soldering interface of Sn–2.0Ag–1.5Zn low Ag content lead-free solder ball and different substrates
title_full Microstructure and morphology of the soldering interface of Sn–2.0Ag–1.5Zn low Ag content lead-free solder ball and different substrates
title_fullStr Microstructure and morphology of the soldering interface of Sn–2.0Ag–1.5Zn low Ag content lead-free solder ball and different substrates
title_full_unstemmed Microstructure and morphology of the soldering interface of Sn–2.0Ag–1.5Zn low Ag content lead-free solder ball and different substrates
title_short Microstructure and morphology of the soldering interface of Sn–2.0Ag–1.5Zn low Ag content lead-free solder ball and different substrates
title_sort microstructure and morphology of the soldering interface of sn–2.0ag–1.5zn low ag content lead-free solder ball and different substrates
topic Research Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9898020/
https://www.ncbi.nlm.nih.gov/pubmed/36747560
http://dx.doi.org/10.1016/j.heliyon.2023.e12952
work_keys_str_mv AT xiaojin microstructureandmorphologyofthesolderinginterfaceofsn20ag15znlowagcontentleadfreesolderballanddifferentsubstrates
AT tongxing microstructureandmorphologyofthesolderinginterfaceofsn20ag15znlowagcontentleadfreesolderballanddifferentsubstrates
AT liangjinhui microstructureandmorphologyofthesolderinginterfaceofsn20ag15znlowagcontentleadfreesolderballanddifferentsubstrates
AT chenquankun microstructureandmorphologyofthesolderinginterfaceofsn20ag15znlowagcontentleadfreesolderballanddifferentsubstrates
AT tangqiming microstructureandmorphologyofthesolderinginterfaceofsn20ag15znlowagcontentleadfreesolderballanddifferentsubstrates