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Improvement of Resistance Change Memory Characteristics in Ferroelectric and Antiferroelectric (like) Parallel Structures

Recently, considerable attention has been paid to the development of advanced technologies such as artificial intelligence (AI) and big data, and high-density, high-speed storage devices are being extensively studied to realize the technology. Ferroelectrics are promising non-volatile memory materia...

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Autores principales: Kho, Wonwoo, Hwang, Hyunjoo, Kim, Jisoo, Park, Gyuil, Ahn, Seung-Eon
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9918946/
https://www.ncbi.nlm.nih.gov/pubmed/36770400
http://dx.doi.org/10.3390/nano13030439
_version_ 1784886702190362624
author Kho, Wonwoo
Hwang, Hyunjoo
Kim, Jisoo
Park, Gyuil
Ahn, Seung-Eon
author_facet Kho, Wonwoo
Hwang, Hyunjoo
Kim, Jisoo
Park, Gyuil
Ahn, Seung-Eon
author_sort Kho, Wonwoo
collection PubMed
description Recently, considerable attention has been paid to the development of advanced technologies such as artificial intelligence (AI) and big data, and high-density, high-speed storage devices are being extensively studied to realize the technology. Ferroelectrics are promising non-volatile memory materials because of their ability to maintain polarization, even when an external electric field is removed. Recently, it has been reported that HfO(2) thin films compatible with complementary metal–oxide–semiconductor (CMOS) processes exhibit ferroelectricity even at a thickness of less than 10 nm. Among the ferroelectric-based memories, ferroelectric tunnel junctions are attracting attention as ideal devices for improving integration and miniaturization due to the advantages of a simple metal–ferroelectric–metal two-terminal structure and low ultra-low power driving through tunneling. The FTJs are driven by adjusting the tunneling electrical resistance through partial polarization switching. Theoretically and experimentally, a large memory window in a broad coercive field and/or read voltage is required to induce sophisticated partial-polarization switching. Notably, antiferroelectrics (like) have different switching properties than ferroelectrics, which are generally applied to ferroelectric tunnel junctions. The memory features of ferroelectric tunnel junctions are expected to be improved through a broad coercive field when the switching characteristics of the ferroelectric and antiferroelectric (like) are utilized concurrently. In this study, the implementation of multiresistance states was improved by driving the ferroelectric and antiferroelectric (like) devices in parallel. Additionally, by modulating the area ratio of ferroelectric and antiferroelectric (like), the memory window size was increased, and controllability was enhanced by increasing the switchable voltage region. In conclusion, we suggest that ferroelectric and antiferroelectric (like) parallel structures may overcome the limitations of the multiresistance state implementation of existing ferroelectrics.
format Online
Article
Text
id pubmed-9918946
institution National Center for Biotechnology Information
language English
publishDate 2023
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-99189462023-02-12 Improvement of Resistance Change Memory Characteristics in Ferroelectric and Antiferroelectric (like) Parallel Structures Kho, Wonwoo Hwang, Hyunjoo Kim, Jisoo Park, Gyuil Ahn, Seung-Eon Nanomaterials (Basel) Article Recently, considerable attention has been paid to the development of advanced technologies such as artificial intelligence (AI) and big data, and high-density, high-speed storage devices are being extensively studied to realize the technology. Ferroelectrics are promising non-volatile memory materials because of their ability to maintain polarization, even when an external electric field is removed. Recently, it has been reported that HfO(2) thin films compatible with complementary metal–oxide–semiconductor (CMOS) processes exhibit ferroelectricity even at a thickness of less than 10 nm. Among the ferroelectric-based memories, ferroelectric tunnel junctions are attracting attention as ideal devices for improving integration and miniaturization due to the advantages of a simple metal–ferroelectric–metal two-terminal structure and low ultra-low power driving through tunneling. The FTJs are driven by adjusting the tunneling electrical resistance through partial polarization switching. Theoretically and experimentally, a large memory window in a broad coercive field and/or read voltage is required to induce sophisticated partial-polarization switching. Notably, antiferroelectrics (like) have different switching properties than ferroelectrics, which are generally applied to ferroelectric tunnel junctions. The memory features of ferroelectric tunnel junctions are expected to be improved through a broad coercive field when the switching characteristics of the ferroelectric and antiferroelectric (like) are utilized concurrently. In this study, the implementation of multiresistance states was improved by driving the ferroelectric and antiferroelectric (like) devices in parallel. Additionally, by modulating the area ratio of ferroelectric and antiferroelectric (like), the memory window size was increased, and controllability was enhanced by increasing the switchable voltage region. In conclusion, we suggest that ferroelectric and antiferroelectric (like) parallel structures may overcome the limitations of the multiresistance state implementation of existing ferroelectrics. MDPI 2023-01-21 /pmc/articles/PMC9918946/ /pubmed/36770400 http://dx.doi.org/10.3390/nano13030439 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Kho, Wonwoo
Hwang, Hyunjoo
Kim, Jisoo
Park, Gyuil
Ahn, Seung-Eon
Improvement of Resistance Change Memory Characteristics in Ferroelectric and Antiferroelectric (like) Parallel Structures
title Improvement of Resistance Change Memory Characteristics in Ferroelectric and Antiferroelectric (like) Parallel Structures
title_full Improvement of Resistance Change Memory Characteristics in Ferroelectric and Antiferroelectric (like) Parallel Structures
title_fullStr Improvement of Resistance Change Memory Characteristics in Ferroelectric and Antiferroelectric (like) Parallel Structures
title_full_unstemmed Improvement of Resistance Change Memory Characteristics in Ferroelectric and Antiferroelectric (like) Parallel Structures
title_short Improvement of Resistance Change Memory Characteristics in Ferroelectric and Antiferroelectric (like) Parallel Structures
title_sort improvement of resistance change memory characteristics in ferroelectric and antiferroelectric (like) parallel structures
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9918946/
https://www.ncbi.nlm.nih.gov/pubmed/36770400
http://dx.doi.org/10.3390/nano13030439
work_keys_str_mv AT khowonwoo improvementofresistancechangememorycharacteristicsinferroelectricandantiferroelectriclikeparallelstructures
AT hwanghyunjoo improvementofresistancechangememorycharacteristicsinferroelectricandantiferroelectriclikeparallelstructures
AT kimjisoo improvementofresistancechangememorycharacteristicsinferroelectricandantiferroelectriclikeparallelstructures
AT parkgyuil improvementofresistancechangememorycharacteristicsinferroelectricandantiferroelectriclikeparallelstructures
AT ahnseungeon improvementofresistancechangememorycharacteristicsinferroelectricandantiferroelectriclikeparallelstructures