Field Modeling of the Influence of Defects Caused by Bending of Conductive Textronic Layers on Their Electrical Conductivity

One of the critical parameters of thin-film electrically conductive structures in wearable electronics systems is their conductivity. In the process of using such structures, especially during bending, defects and microcracks appear that affect their electrical parameters. Understanding these phenom...

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Detalles Bibliográficos
Autores principales: Pawłowski, Stanisław, Plewako, Jolanta, Korzeniewska, Ewa
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9920672/
https://www.ncbi.nlm.nih.gov/pubmed/36772529
http://dx.doi.org/10.3390/s23031487

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9920672/
https://www.ncbi.nlm.nih.gov/pubmed/36772529
http://dx.doi.org/10.3390/s23031487

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