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Multiple Retest Systems for Screening High-Quality Chips
In this study, we develop a digital integrated circuit testing model (DITM) based on a statistical simulation method to evaluate the test quality and yield of integrated circuit products. This model can be used to quantify the characteristics of the device under test (DUT) and simulate the effect of...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Springer US
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9939376/ http://dx.doi.org/10.1007/s10836-023-06051-0 |