Machine-learning-assisted analysis of transition metal dichalcogenide thin-film growth

In situ reflective high-energy electron diffraction (RHEED) is widely used to monitor the surface crystalline state during thin-film growth by molecular beam epitaxy (MBE) and pulsed laser deposition. With the recent development of machine learning (ML), ML-assisted analysis of RHEED videos aids in...

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Detalles Bibliográficos
Autores principales: Kim, Hyuk Jin, Chong, Minsu, Rhee, Tae Gyu, Khim, Yeong Gwang, Jung, Min-Hyoung, Kim, Young-Min, Jeong, Hu Young, Choi, Byoung Ki, Chang, Young Jun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer Nature Singapore 2023
Materias:
Full Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9941396/
https://www.ncbi.nlm.nih.gov/pubmed/36806667
http://dx.doi.org/10.1186/s40580-023-00359-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9941396/
https://www.ncbi.nlm.nih.gov/pubmed/36806667
http://dx.doi.org/10.1186/s40580-023-00359-5

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