OVERCOMING RESOLUTION LOSS DUE TO THERMAL MAGNETIC FIELD FLUCTUATIONS FROM PHASE PLATES IN TRANSMISSION ELECTRON MICROSCOPY

We identify thermal magnetic field fluctuations, caused by thermal electron motion (“Johnson noise”) in electrically conductive materials, as a potential resolution limit in transmission electron microscopy with a phase plate. Specifically, resolution loss can occur if the electron diffraction patte...

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Detalles Bibliográficos
Autores principales: Axelrod, Jeremy J., Petrov, Petar N., Zhang, Jessie T., Remis, Jonathan, Buijsse, Bart, Glaeser, Robert M., Mȕller, Holger
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Cold Spring Harbor Laboratory 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9949102/
https://www.ncbi.nlm.nih.gov/pubmed/36824829
http://dx.doi.org/10.1101/2023.02.12.528160

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9949102/
https://www.ncbi.nlm.nih.gov/pubmed/36824829
http://dx.doi.org/10.1101/2023.02.12.528160

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