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Enhancement of the Surface Morphology of (Bi(0.4)Sb(0.6))(2)Te(3) Thin Films by In Situ Thermal Annealing
The study of the exotic properties of the surface states of topological insulators requires defect-free and smooth surfaces. This work aims to study the enhancement of the surface morphology of optimally doped, high-crystalline (Bi(0.4)Sb(0.6))(2)Te(3) films deposited by molecular beam epitaxy on Al...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9961334/ https://www.ncbi.nlm.nih.gov/pubmed/36839131 http://dx.doi.org/10.3390/nano13040763 |