Light-Sensing Properties of Amorphous Vanadium Oxide Films Prepared by RF Sputtering

In this study we analyzed the structure and light-sensing properties of as-deposited vanadium oxide thin films, prepared by RF sputtering in different Ar:O(2) flow rate conditions, at low temperature (e.g., 65 °C). X-ray diffraction (XRD), Scanning Electron Microscopy (SEM-EDX), Raman spectroscopy a...

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Detalles Bibliográficos
Autores principales: Plugaru, Rodica, Mihalache, Iuliana, Romaniţan, Cosmin, Comanescu, Florin, Vulpe, Silviu, Craciun, Gabriel, Plugaru, Neculai, Djourelov, Nikolay
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9964540/
https://www.ncbi.nlm.nih.gov/pubmed/36850358
http://dx.doi.org/10.3390/s23041759

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9964540/
https://www.ncbi.nlm.nih.gov/pubmed/36850358
http://dx.doi.org/10.3390/s23041759

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