New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix
In this work we demonstrate that Medium Energy Ion Scattering (MEIS) measurements in combination with Transmission Electron Microscopy (TEM) or Grazing Incidence Small Angle X-Ray Scattering (GISAXS) can provide a complete characterization of nanoparticle (NP) systems embedded into dielectric films....
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2013
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3849636/ https://www.ncbi.nlm.nih.gov/pubmed/24301257 http://dx.doi.org/10.1038/srep03414 |
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author | Sanchez, Dario F. Marmitt, Gabriel Marin, Cristiane Baptista, Daniel L. de M. Azevedo, Gustavo Grande, Pedro L. Fichtner, Paulo F. P. |
author_facet | Sanchez, Dario F. Marmitt, Gabriel Marin, Cristiane Baptista, Daniel L. de M. Azevedo, Gustavo Grande, Pedro L. Fichtner, Paulo F. P. |
author_sort | Sanchez, Dario F. |
collection | PubMed |
description | In this work we demonstrate that Medium Energy Ion Scattering (MEIS) measurements in combination with Transmission Electron Microscopy (TEM) or Grazing Incidence Small Angle X-Ray Scattering (GISAXS) can provide a complete characterization of nanoparticle (NP) systems embedded into dielectric films. This includes the determination of the nanoparticle characteristics (location, size distribution and number concentration) as well as the depth distribution and concentration of the NP atomic components dispersed in the matrix. Our studies are performed considering a model case system consisting of planar arrangements of Au NPs (size range from 1 to 10 nm) containing three distinct Au concentrations embedded in a SiO(2) film. |
format | Online Article Text |
id | pubmed-3849636 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2013 |
publisher | Nature Publishing Group |
record_format | MEDLINE/PubMed |
spelling | pubmed-38496362013-12-05 New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix Sanchez, Dario F. Marmitt, Gabriel Marin, Cristiane Baptista, Daniel L. de M. Azevedo, Gustavo Grande, Pedro L. Fichtner, Paulo F. P. Sci Rep Article In this work we demonstrate that Medium Energy Ion Scattering (MEIS) measurements in combination with Transmission Electron Microscopy (TEM) or Grazing Incidence Small Angle X-Ray Scattering (GISAXS) can provide a complete characterization of nanoparticle (NP) systems embedded into dielectric films. This includes the determination of the nanoparticle characteristics (location, size distribution and number concentration) as well as the depth distribution and concentration of the NP atomic components dispersed in the matrix. Our studies are performed considering a model case system consisting of planar arrangements of Au NPs (size range from 1 to 10 nm) containing three distinct Au concentrations embedded in a SiO(2) film. Nature Publishing Group 2013-12-04 /pmc/articles/PMC3849636/ /pubmed/24301257 http://dx.doi.org/10.1038/srep03414 Text en Copyright © 2013, Macmillan Publishers Limited. All rights reserved http://creativecommons.org/licenses/by-nc-nd/3.0/ This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported License. To view a copy of this license, visit http://creativecommons.org/licenses/by-nc-nd/3.0/ |
spellingShingle | Article Sanchez, Dario F. Marmitt, Gabriel Marin, Cristiane Baptista, Daniel L. de M. Azevedo, Gustavo Grande, Pedro L. Fichtner, Paulo F. P. New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix |
title | New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix |
title_full | New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix |
title_fullStr | New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix |
title_full_unstemmed | New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix |
title_short | New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix |
title_sort | new approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3849636/ https://www.ncbi.nlm.nih.gov/pubmed/24301257 http://dx.doi.org/10.1038/srep03414 |
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