New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix

In this work we demonstrate that Medium Energy Ion Scattering (MEIS) measurements in combination with Transmission Electron Microscopy (TEM) or Grazing Incidence Small Angle X-Ray Scattering (GISAXS) can provide a complete characterization of nanoparticle (NP) systems embedded into dielectric films....

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Detalles Bibliográficos
Autores principales: Sanchez, Dario F., Marmitt, Gabriel, Marin, Cristiane, Baptista, Daniel L., de M. Azevedo, Gustavo, Grande, Pedro L., Fichtner, Paulo F. P.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2013
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3849636/
https://www.ncbi.nlm.nih.gov/pubmed/24301257
http://dx.doi.org/10.1038/srep03414
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author Sanchez, Dario F.
Marmitt, Gabriel
Marin, Cristiane
Baptista, Daniel L.
de M. Azevedo, Gustavo
Grande, Pedro L.
Fichtner, Paulo F. P.
author_facet Sanchez, Dario F.
Marmitt, Gabriel
Marin, Cristiane
Baptista, Daniel L.
de M. Azevedo, Gustavo
Grande, Pedro L.
Fichtner, Paulo F. P.
author_sort Sanchez, Dario F.
collection PubMed
description In this work we demonstrate that Medium Energy Ion Scattering (MEIS) measurements in combination with Transmission Electron Microscopy (TEM) or Grazing Incidence Small Angle X-Ray Scattering (GISAXS) can provide a complete characterization of nanoparticle (NP) systems embedded into dielectric films. This includes the determination of the nanoparticle characteristics (location, size distribution and number concentration) as well as the depth distribution and concentration of the NP atomic components dispersed in the matrix. Our studies are performed considering a model case system consisting of planar arrangements of Au NPs (size range from 1 to 10 nm) containing three distinct Au concentrations embedded in a SiO(2) film.
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spelling pubmed-38496362013-12-05 New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix Sanchez, Dario F. Marmitt, Gabriel Marin, Cristiane Baptista, Daniel L. de M. Azevedo, Gustavo Grande, Pedro L. Fichtner, Paulo F. P. Sci Rep Article In this work we demonstrate that Medium Energy Ion Scattering (MEIS) measurements in combination with Transmission Electron Microscopy (TEM) or Grazing Incidence Small Angle X-Ray Scattering (GISAXS) can provide a complete characterization of nanoparticle (NP) systems embedded into dielectric films. This includes the determination of the nanoparticle characteristics (location, size distribution and number concentration) as well as the depth distribution and concentration of the NP atomic components dispersed in the matrix. Our studies are performed considering a model case system consisting of planar arrangements of Au NPs (size range from 1 to 10 nm) containing three distinct Au concentrations embedded in a SiO(2) film. Nature Publishing Group 2013-12-04 /pmc/articles/PMC3849636/ /pubmed/24301257 http://dx.doi.org/10.1038/srep03414 Text en Copyright © 2013, Macmillan Publishers Limited. All rights reserved http://creativecommons.org/licenses/by-nc-nd/3.0/ This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported License. To view a copy of this license, visit http://creativecommons.org/licenses/by-nc-nd/3.0/
spellingShingle Article
Sanchez, Dario F.
Marmitt, Gabriel
Marin, Cristiane
Baptista, Daniel L.
de M. Azevedo, Gustavo
Grande, Pedro L.
Fichtner, Paulo F. P.
New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix
title New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix
title_full New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix
title_fullStr New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix
title_full_unstemmed New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix
title_short New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix
title_sort new approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3849636/
https://www.ncbi.nlm.nih.gov/pubmed/24301257
http://dx.doi.org/10.1038/srep03414
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