The Design of the Emission Layer for Electron Multipliers

The electron multipliers gain is closely related to the secondary electron emission coefficient (SEE) of the emission layer materials. The SEE is closely related to the thickness of the emission layer. If the emission layer is thin, the low SEE causes the low gain of electron multipliers. If the emi...

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Autores principales: Wang, Yuman, Yan, Baojun, Wen, Kaile, Liu, Shulin, Qi, Ming, Zhang, Binting, Gu, Jianyu, Yao, Wenjing
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2021
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Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8497682/
https://www.ncbi.nlm.nih.gov/pubmed/34622366
http://dx.doi.org/10.1186/s11671-021-03606-y
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author Wang, Yuman
Yan, Baojun
Wen, Kaile
Liu, Shulin
Qi, Ming
Zhang, Binting
Gu, Jianyu
Yao, Wenjing
author_facet Wang, Yuman
Yan, Baojun
Wen, Kaile
Liu, Shulin
Qi, Ming
Zhang, Binting
Gu, Jianyu
Yao, Wenjing
author_sort Wang, Yuman
collection PubMed
description The electron multipliers gain is closely related to the secondary electron emission coefficient (SEE) of the emission layer materials. The SEE is closely related to the thickness of the emission layer. If the emission layer is thin, the low SEE causes the low gain of electron multipliers. If the emission layer is thick, the conductive layer can't timely supplement charge to the emission layer, the electronic amplifier gain is low too. The electron multipliers usually choose Al(2)O(3) and MgO film as the emission layer because of the high SEE level. MgO easy deliquescence into Mg(OH)(2) Mg(2)(OH)(2)CO(3) and MgCO(3) resulting in the lower SEE level. The SEE level of Al(2)O(3) is lower than MgO, but Al(2)O(3) is stable. We designed a spherical system for testing the SEE level of materials, and proposed to use low-energy secondary electrons instead of low-energy electron beam for neutralization to measuring the SEE level of Al(2)O(3), MgO, MgO/Al(2)O(3), Al(2)O(3)/MgO, and precisely control the film thickness by using atomic layer deposition. We propose to compare the SEE under the adjacent incident electrons energy to partition the SEE value of the material, and obtain four empirical formulas for the relationship between SEE and thickness. Since the main materials that cause the decrease in SEE are Mg(2)(OH)(2)CO(3) and MgCO(3), we use the C element atomic concentration measured by XPS to study the deliquescent depth of the material. We propose to use the concept of transition layer for SEE interpretation of multilayer materials. Through experiments and calculations, we put forward a new emission layer for electron multipliers, including 2–3 nm Al(2)O(3) buffer layer, 5–9 nm MgO main-body layer, 1 nm Al(2)O(3) protective layer or 0.3 nm Al(2)O(3) enhancement layer. We prepared this emission layer to microchannel plate (MCP), which significantly improved the gain of MCP. We can also apply this new emission layer to channel electron multiplier and separate electron multiplier.
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spelling pubmed-84976822021-10-08 The Design of the Emission Layer for Electron Multipliers Wang, Yuman Yan, Baojun Wen, Kaile Liu, Shulin Qi, Ming Zhang, Binting Gu, Jianyu Yao, Wenjing Nanoscale Res Lett Nano Express The electron multipliers gain is closely related to the secondary electron emission coefficient (SEE) of the emission layer materials. The SEE is closely related to the thickness of the emission layer. If the emission layer is thin, the low SEE causes the low gain of electron multipliers. If the emission layer is thick, the conductive layer can't timely supplement charge to the emission layer, the electronic amplifier gain is low too. The electron multipliers usually choose Al(2)O(3) and MgO film as the emission layer because of the high SEE level. MgO easy deliquescence into Mg(OH)(2) Mg(2)(OH)(2)CO(3) and MgCO(3) resulting in the lower SEE level. The SEE level of Al(2)O(3) is lower than MgO, but Al(2)O(3) is stable. We designed a spherical system for testing the SEE level of materials, and proposed to use low-energy secondary electrons instead of low-energy electron beam for neutralization to measuring the SEE level of Al(2)O(3), MgO, MgO/Al(2)O(3), Al(2)O(3)/MgO, and precisely control the film thickness by using atomic layer deposition. We propose to compare the SEE under the adjacent incident electrons energy to partition the SEE value of the material, and obtain four empirical formulas for the relationship between SEE and thickness. Since the main materials that cause the decrease in SEE are Mg(2)(OH)(2)CO(3) and MgCO(3), we use the C element atomic concentration measured by XPS to study the deliquescent depth of the material. We propose to use the concept of transition layer for SEE interpretation of multilayer materials. Through experiments and calculations, we put forward a new emission layer for electron multipliers, including 2–3 nm Al(2)O(3) buffer layer, 5–9 nm MgO main-body layer, 1 nm Al(2)O(3) protective layer or 0.3 nm Al(2)O(3) enhancement layer. We prepared this emission layer to microchannel plate (MCP), which significantly improved the gain of MCP. We can also apply this new emission layer to channel electron multiplier and separate electron multiplier. Springer US 2021-10-07 /pmc/articles/PMC8497682/ /pubmed/34622366 http://dx.doi.org/10.1186/s11671-021-03606-y Text en © The Author(s) 2021 https://creativecommons.org/licenses/by/4.0/Open AccessThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle Nano Express
Wang, Yuman
Yan, Baojun
Wen, Kaile
Liu, Shulin
Qi, Ming
Zhang, Binting
Gu, Jianyu
Yao, Wenjing
The Design of the Emission Layer for Electron Multipliers
title The Design of the Emission Layer for Electron Multipliers
title_full The Design of the Emission Layer for Electron Multipliers
title_fullStr The Design of the Emission Layer for Electron Multipliers
title_full_unstemmed The Design of the Emission Layer for Electron Multipliers
title_short The Design of the Emission Layer for Electron Multipliers
title_sort design of the emission layer for electron multipliers
topic Nano Express
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8497682/
https://www.ncbi.nlm.nih.gov/pubmed/34622366
http://dx.doi.org/10.1186/s11671-021-03606-y
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